Turret Test & Vision
32-position turret platform for testing, inspection, laser marking and sorting.
PM31-T/PM35-T/PM38-T
Turret Test & Vision Handler
A high-speed turret platform designed for discrete & ICs testing and vision inspection along with optional features such as laser marking, sorting,
de-taping and taping depending on your requirements.
| Vibrator Bowl, Plastic Tube Stacker, De-Taper, JEDEC Tray | |
| Tape & Reel, Plastic Tube Stacker, JEDEC Tray | |
| TO, DPAK, PDIP, SOIC, TSSOP, SOT, QFN | |
| Lead, Mark, Package, Pad Inspection | |
| Electrical Functional Test | |
| Up to 8 parallel test sites | |
| Up to 10N independent Z axis Up to 50N independent Z axis (optional) Up to 80N with Pneumatic Solution (optional) |
A complete turnkey solution with comprehensive features for a wide array of packages.
PM38
Wafer-Level Die Sorter
A complete turnkey solution with comprehensive features from wafer input, electrical functional test, stimulus test, 6-sided inspection, sorting to tape & reel for a wide array of packages.
| Mylar Wafer Ring [8”, 10”, 12”], De-Taper [optional] | |
| Tape & Reel [with auto reel changer], JEDEC Tray | |
| Semiconductors [Leadless Packages: Discrete DFN, QFN] [Leaded Packages: Leaded SOIC, MSOP, TSSOP, TO252, TO263, SOT223, SC70, SOT, SOD, SC79] LEDs MEMS Microphone [Top port/Bottom port] Optical Sensors [Structured Light 3D Sensor, Time of Flight 3D Sensor, Proximity Sensor, Ambient Light Sensor, Spectrum Sensor, 3D Magnetic Sensor] |
|
| Top Vision Inspection, 2D Pad Measurement, 3D Measurement, Post Seal Inspection, Active Die Inspection, In-Pocket Inspection | |
| Electrical Functional Test, Stimulus Test [Sensitivity Test], Signal to Noise Ratio (SNR) Test, LED Wavelength & Radiant Test, Photo Diode Sensitivity Test, Light Current Voltage (LIV) Slope Test, Cross Talk & Measurement Test, Magnetic Test] | |
| Up to 8 sites |