Pressemitteilungen
High Power/Voltage Wafer-Level Burn-in Test Solution for Silicon Carbide (SiC)
Trooper-V: Wafer AOI Solution which eliminates reliance on human handling while optimizing productivity and yield.
Latest µLED Display Module Final Test Solution which empowers display manufacturers to maximize efficiency and yield.
Pentamaster launches its first ever Tri-Temperature Test technology for Optics Sensors.
Pentamaster unveils Burn-in Test Solutions for Power Devices with User Definable Burn-in Profile
Introducing Pentamaster’s One Stop Test & Active Alignment Assembling Solutions for 3D Smart Sensors
High Precision Micron Laser Marking Solution for Wafer-Level Packages.
Revolutionary Breakthrough Technologies for IGBT Solutions
Introducing Our 3D Sensors Imaging & Depth Test Solutions
