VCSEL

Full turnkey burn-in test & probing solution for VCSEL at wafer-level.

Trooper-BI
Wafer-Level VCSEL Burn-in Test Handler
Full turnkey burn-in test & probing solution for wafer-level VCSEL, capable of testing up to 1,500 DUTs in one pass with a controlled temperature up to 190°C.

Package Type
(VCSEL, LED)

Channel Number
(Up to 1,500 per wafer unit)

Burn-in Duration
(Programmable)

Probing Pogo Pin Accuracy
(±50μm)

Electrical Parameter Measurements
Current Source Range: ±20mA~1,500mA
Current Measurement Tolerance: 0.2mA or ±1%
Compliance Voltage: 24V DC
Voltage Source Range: 5~24V DC
Voltage Source Accuracy: 20mV or ±1%

Programable Temperature Control
Temperature Measuring Control: Ambient~190°C
Temperature Setting Range: 25°C~250°C
Temperature Setting Resolution: 0.1°C~0.5°C
Operation Temperature: 20°C~30°C
Operation Humidity: <85%RH, Non-Condensing

Optional Features
(Vision Inspection Capability on wafer unit’s surfaces)
(Pass/Reject statuses indicated in tile)
(Current (If) and Voltage (Vf) monitoring for individual unit)
(Golden unit monitoring)

LEDPerforms burn-in test on wafer-level LEDs under high humidity, temperature and current. 

LED Burn-in Test Handler
A fully customizable burn-in test handler for LED featuring programmable constant drivers and individual constantly current driver as well as open short test monitoring. 

Package Type
(LED)

Channel Number
(Up to 4,000 per wafer unit)

Burn-in Duration
(Programmable)

Electrical Parameter Measurements
Current Source Range: ±20mA~100mA
Current Measurement Tolerance: 0.2mA or ±1%
Compliance Voltage: 24V DC
Voltage Source Range: 5~24V DC
Voltage Source Accuracy: 20mV or ±1%

Programable Temperature Control
Temperature Measuring Control: Ambient~130°C
Temperature Setting Range: 45°C~130°C
Temperature Setting Resolution: 0.1°C
Operation Temperature: 20°C~30°C
Operation Humidity: <85%RH, Non-Condensing

Optional Features
(Vision Inspection Capability on wafer unit’s surfaces)
(Pass/Reject statuses indicated in tile)
(Current (If) and Voltage (Vf) monitoring for individual unit)
(Probe cleaning)
(Golden unit monitoring)