Module-Level Test
GIDEON
Ambient Light Calibration Sensor Test Handler
It precisely calibrates the sensor's response by using broadband spectral sweep through nanometer step tunable light source while testing the sensor in various lightings at different spectrums to test the sensor's capability to precisely sense and react to the differences.
JEDEC Tray | |
Ambient Light Sensors | |
Light Leakage Test, Sensor Responsivity & Linearity Test, Spectrum Calibration, Sensor Spectrum Measurement Validation | |
Multiple Test Cells Up to 108 Parallel test sites | |
300nm~1100nm | |
Unit Present/Absent Inspection, Positioning Verification | |
Automated golden unit monitoring, Spectrometer audit control, Automated GR&R <10%, Automated retest, Run time log, Automated low yield monitoring, UPH tracker, Test site disable |
GIDEON
Proximity Sensor Test Handler
A fully automated test & qualify system for full LIV testing, beam profile characteristics measurements, photodiode sensitivity & responsiveness test
and module functional & reflectance standards test for proximity sensors.
JEDEC Tray | |
Proximity Sensor | |
LIV Sweep Test, Module Reflectance Test, PD Sensitivity & Responsiveness Test | |
Up to 32 parallel sites | |
Automated golden unit monitoring, Automated yield monitoring, Automated retest, Automated GR&R <10% |
GIDEON
Structured Light 3D Sensor Test Handler
It performs high speed LIV sweep tests while analyzing the dot projector’s pattern & flood illumination characteristics and validates them to be safe for
the human eyes for real world applications.
JEDEC Tray | |
JEDEC Tray, Tape & Reel | |
System Alignment, DUT position and orientation, 2D Matrix inspection, 6-Sided AOI Inspection [Optional] | |
LIV Sweep Test, Far Field Test | |
Up to 12 sites | |
Automated golden unit monitoring, Automated yield monitoring, Automated retest, Automated site/nest disable, Automated pogo pins cleaning, Automated GR&R <10% |
GIDEON
Time of Flight 3D Sensor Test Handler
It test and analyze the sensitivity & responsiveness of the photodiode to reflected lights through various types of reflectance targets at different heights and distances.
JEDEC Tray | |
Time of Flight 3D Sensors | |
LIV Sweep Test, Far Field Test | |
Up to 12 sites | |
2D Matrix Inspection | |
Automated golden unit monitoring, Automated yield monitoring, Automated retest, Automated site/nest disable, Automated GR&R <10% |
GIDEON
AR/VR Miniature Image Sensor Test Handler
It is a high-parallel test platform that uses a series of image charts at different working distances to test the performance of the miniature image
sensors/endoscopes to meet standard ISO and EMVA 1288 standards.
Customized tray | |
Miniature Image Sensor, Endoscope | |
Electrical Functional Test, Edge Spatial Frequency Response [ESFR] ISO Test Chart, Dynamic Range Test Chart, High Uniformity Illumination Flat Light, Checker Board | |
Up to 12 parallel sites | |
Active Alignment/positioning of test sockets | |
Automated alignment/positioning of test sockets, Programmable light source color temperature for sensor testing |
GIDEON
VCSEL Test Handler
Fully automated test handler designed to test both electrical & optical characteristics of VCSELs at module-level.
JEDEC Tray | |
JEDEC Tray, Tape & Reel | |
System Alignment, DUT position and orientation, 2D Matrix inspection, 6-Sided AOI Inspection [Optional] | |
LIV Sweep Test, Far Field Test | |
Up to 12 sites | |
Automated golden unit monitoring, Automated yield monitoring, Automated retest, Automated site/nest disable, Automated pogo pins cleaning, Automated GR&R <10% |
Queen-QCP
Edge-Emitting Laser Test Handler
It is a fully automated test & qualify system for full LIV sweep test as well as spectral and far-field beam characterization of edge-emitting lasers (EEL).
JEDEC Tray | |
Edge Emitting Laser | |
LIV Sweep Test, Laser Far Field Test | |
Dimension Inspection | |
Tray map file integration, Automated optical inspection, Automated yield monitoring, Automated GR&R <10% |
Micro LED
Micro LED Test Handler
It provides a comprehensive test system for μLED which deliver fast & precise results with simultaneous spot measurement analysis within a single capture in either a whole display or individual pixel analyzation.
REL Board, JEDEC Tray | |
μLED | |
Colorimeter Image Test, Electrical Functional Test | |
2DBC Scanning, DUT Alignment |
PM38
PM38 MEMS Microphone Test Handler
A complete turnkey solution with comprehensive features from wafer input, electrical functional test, stimulus test, 6-sided inspection, sorting to tape &
reel for microphones.
Mylar Wafer Ring [8”, 10”, 12”], De-Taper [optional] | |
Tape & Reel [with auto reel changer], JEDEC Tray | |
MEMS Microphone [Top port/Bottom port] | |
Top Vision Inspection, 2D Pad Measurement, 3D Measurement, Post Seal Inspection, Active Die Inspection, In-Pocket Inspection | |
Electrical Functional Test, Stimulus Test [Sensitivity Test], Signal to Noise Ratio (SNR) Test | |
Up to 8 sites |
PM57-MS
PM57-MS Gyro Motion Sensor Test Handler
A high parallelism test handler which performs precise sensing test on angular velocity, measure and calibrate proper acceleration of gyroscopes and
accelerometers.
Vibrator Bowl, JEDEC Tray, Plastic Tube Stacker | |
Tape & Reel, Canister Bins, Plastic Tube Stacker | |
QFN, MEMS Motion Sensor | |
Inner Axis & Twist Axis: Maximum Speed 500°/seconds, Speed Accuracy ±0.1% Pick & Place: Linear Motor Type for X-Axis, Ball Screw Actuator Design Type for Z-Axis, Gang Pick Design (12x), Vacuum Switch Detention for each unit, Low Noise |
|
Up to 72 parallel test sites | |
Device Orientation |