Wafer-Level Test
WLBI-22
Wafer-Level SiC Test Handler
A high-performance handler that offers multiple probe tests reaching up to 1800 test channels per wafer with independent drivers for simultaneous voltage/current measurement and temperature monitoring.
| Wafer Cassette Handling | |
| Silicon Carbide (SiC) Power devices | |
| Up to 1800 per wafer unit | |
|
Pre/Post Test (IGSS, IDSS, Vth, VSD) Stress Test (IGSS, IDSS) |
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| Gas control system for arc suppression gas |